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物理乱数の一様性の偏りと統計的ゆらぎに関する考察
https://tsuyama-nit.repo.nii.ac.jp/records/568
https://tsuyama-nit.repo.nii.ac.jp/records/5680ec9d8fa-4858-4187-9468-a89b26d31ce9
名前 / ファイル | ライセンス | アクション |
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津山工業高等専門学校紀要_42-8.pdf (2.4 MB)
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2001-01-04 | |||||
タイトル | ||||||
タイトル | 物理乱数の一様性の偏りと統計的ゆらぎに関する考察 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | A Study for Biases and Statistical Fluctuations of Random Numbers Generated by Physical Means | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Random number | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Random number generation | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Phisical random number | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
著者 |
岸本, 俊祐
× 岸本, 俊祐 |
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著者(別表記) | ||||||
識別子Scheme | WEKO | |||||
識別子 | 6986 | |||||
姓名 | Kishimoto, shunsuke | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | About 1 × 10(9) random digits were generated by a simple electronic device. A statistical frequency test was carried out to check the uniformity of probability that each digit occured. The frequency tests were also applied to many parts of a series of the random digits to examine the local fluctuations of the uniformity. If the physical device has defects, there are biases of the uniformity. On the other hand, even if a sequence of the random digits is an ideal one, it has a distribution of each digit biased by statistical fluctuations. This paper makes the relation between the former and the latter clear. | |||||
日本十進分類法 | ||||||
主題Scheme | NDC | |||||
主題 | 410 | |||||
書誌情報 |
津山工業高等専門学校紀要 en : Bulletin of Tsuyama National College of Technology 巻 42, p. 41-45, 発行日 2001-01-04 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0287-7066 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00149351 | |||||
著者版フラグ | ||||||
内容記述タイプ | Other | |||||
内容記述 | publisher |