{"created":"2023-07-25T10:05:34.243459+00:00","id":568,"links":{},"metadata":{"_buckets":{"deposit":"60da159c-0aed-4d15-a4ef-7a2bf173388e"},"_deposit":{"created_by":2,"id":"568","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"568"},"status":"published"},"_oai":{"id":"oai:tsuyama-nit.repo.nii.ac.jp:00000568","sets":["2:5:48"]},"author_link":["6986","6985"],"item_10002_biblio_info_25":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-01-04","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"45","bibliographicPageStart":"41","bibliographicVolumeNumber":"42","bibliographic_titles":[{"bibliographic_title":"津山工業高等専門学校紀要"},{"bibliographic_title":"Bulletin of Tsuyama National College of Technology","bibliographic_titleLang":"en"}]}]},"item_10002_description_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_description":"publisher","subitem_description_type":"Other"}]},"item_10002_description_6":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"About 1 × 10(9) random digits were generated by a simple electronic device. A statistical frequency test was carried out to check the uniformity of probability that each digit occured. The frequency tests were also applied to many parts of a series of the random digits to examine the local fluctuations of the uniformity. If the physical device has defects, there are biases of the uniformity. On the other hand, even if a sequence of the random digits is an ideal one, it has a distribution of each digit biased by statistical fluctuations. This paper makes the relation between the former and the latter clear.","subitem_description_type":"Abstract"}]},"item_10002_full_name_4":{"attribute_name":"著者（別表記）","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"6986","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kishimoto, shunsuke"}]}]},"item_10002_source_id_10":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0287-7066","subitem_source_identifier_type":"ISSN"}]},"item_10002_source_id_12":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00149351","subitem_source_identifier_type":"NCID"}]},"item_10002_subject_20":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"410","subitem_subject_scheme":"NDC"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"岸本, 俊祐"}],"nameIdentifiers":[{"nameIdentifier":"6985","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2001-01-04"}],"displaytype":"detail","filename":"津山工業高等専門学校紀要_42-8.pdf","filesize":[{"value":"2.4 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"津山工業高等専門学校紀要_42-8.pdf","url":"https://tsuyama-nit.repo.nii.ac.jp/record/568/files/津山工業高等専門学校紀要_42-8.pdf"},"version_id":"5d639d57-ea43-4672-bb73-1e89e98eb21e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Random number","subitem_subject_scheme":"Other"},{"subitem_subject":"Random number generation","subitem_subject_scheme":"Other"},{"subitem_subject":"Phisical random number","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"物理乱数の一様性の偏りと統計的ゆらぎに関する考察","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"物理乱数の一様性の偏りと統計的ゆらぎに関する考察"},{"subitem_title":"A Study for Biases and Statistical Fluctuations of Random Numbers Generated by Physical Means","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["48"],"pubdate":{"attribute_name":"公開日","attribute_value":"2001-01-04"},"publish_date":"2001-01-04","publish_status":"0","recid":"568","relation_version_is_last":true,"title":["物理乱数の一様性の偏りと統計的ゆらぎに関する考察"],"weko_creator_id":"2","weko_shared_id":2},"updated":"2023-07-25T10:26:40.647709+00:00"}