{"created":"2023-07-25T10:06:15.443040+00:00","id":1536,"links":{},"metadata":{"_buckets":{"deposit":"750f564c-8bcc-42e5-9356-6e65a83f2658"},"_deposit":{"created_by":4,"id":"1536","owners":[4],"pid":{"revision_id":0,"type":"depid","value":"1536"},"status":"published"},"_oai":{"id":"oai:tsuyama-nit.repo.nii.ac.jp:00001536","sets":["2:5:20"]},"author_link":["8305","8302","8306","8304","8303","8301"],"item_10002_biblio_info_25":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1977-03-15","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"87","bibliographicPageStart":"83","bibliographicVolumeNumber":"14","bibliographic_titles":[{"bibliographic_title":"津山工業高等専門学校紀要"},{"bibliographic_title":"Bulletin of Tsuyama National College of Technology","bibliographic_titleLang":"en"}]}]},"item_10002_description_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_description":"publisher","subitem_description_type":"Other"}]},"item_10002_description_6":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this report, a method for measuring the apparent density of evaporated thin Ag films is described. This measurement is based on the use of a digital thickness monitor and a multiple beam interferometer. The measured values by this method are compared with the values obtained by the weighing method. An empirical formula which expresses the relation between the thickness and the apparent density of evaporated thin films is proposed.","subitem_description_type":"Abstract"}]},"item_10002_full_name_4":{"attribute_name":"著者（別表記）","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"8304","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Okada, Tadashi"}]},{"nameIdentifiers":[{"nameIdentifier":"8305","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kishimoto, Shunsuke"}]},{"nameIdentifiers":[{"nameIdentifier":"8306","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Fujita, Shiro"}]}]},"item_10002_publisher_9":{"attribute_name":"出版者（別表記）","attribute_value_mlt":[{"subitem_publisher":"National Institute of Technology, Tsuyama College"}]},"item_10002_source_id_10":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0287-7066","subitem_source_identifier_type":"ISSN"}]},"item_10002_source_id_12":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00149351","subitem_source_identifier_type":"NCID"}]},"item_10002_subject_20":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"430","subitem_subject_scheme":"NDC"}]},"item_10002_text_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_text_value":"津山工業高等専門学校"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"岡田, 正"}],"nameIdentifiers":[{"nameIdentifier":"8301","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岸本, 俊祐"}],"nameIdentifiers":[{"nameIdentifier":"8302","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤田, 志郎"}],"nameIdentifiers":[{"nameIdentifier":"8303","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"1977-03-15"}],"displaytype":"detail","filename":"津山工業高等専門学校紀要_14-11.pdf","filesize":[{"value":"281.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"津山工業高等専門学校紀要_14-11.pdf","url":"https://tsuyama-nit.repo.nii.ac.jp/record/1536/files/津山工業高等専門学校紀要_14-11.pdf"},"version_id":"a60fc494-b172-4b08-aff4-ff4b48418be6"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"銀蒸着薄膜の密度測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"銀蒸着薄膜の密度測定"},{"subitem_title":"A Method of Measurement of the Apparent Density of Evaporated Thin Ag Films","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"4","path":["20"],"pubdate":{"attribute_name":"公開日","attribute_value":"1977-03-15"},"publish_date":"1977-03-15","publish_status":"0","recid":"1536","relation_version_is_last":true,"title":["銀蒸着薄膜の密度測定"],"weko_creator_id":"4","weko_shared_id":-1},"updated":"2023-07-25T10:17:30.309253+00:00"}